Browse Books: Technology & Engineering / Measurement

Introduction to Focused Ion Beam Nanometrology (Iop Concise Physics) Cover Image
$149.93
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I Capricci del Caso: Introduzione Alla Statistica, Al Calcolo Della Probabilità E Alla Teoria Degli Errori (Unitext / Collana Di Fisica E Astronomia) Cover Image
$52.49
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Particle Image Velocimetry: A Practical Guide Cover Image
$209.99
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Quantum State Estimation (Lecture Notes in Physics #649) Cover Image
By Matteo Paris (Editor), Jaroslav Rehacek (Editor)
$164.99
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Neutron Spin Echo Spectroscopy: Basics, Trends and Applications (Lecture Notes in Physics #601) Cover Image
By Ferenc Mezei (Editor), Catherine Pappas (Editor), Thomas Gutberlet (Editor)
$209.99
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Time in Quantum Mechanics (Lecture Notes in Physics #734) Cover Image
By Gonzalo Muga (Editor), R. Sala Mayato (Editor), Inigo Egusquiza (Editor)
$127.49
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Particle Detection with Drift Chambers (Particle Acceleration and Detection) Cover Image
$224.99
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Nanometrology Using the Transmission Electron Microscope (Iop Concise Physics) Cover Image
$104.93
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The Ten Commandments for Effective Standards: Practical Insights for Creating Technical Standards (Synopsys Press Business) Cover Image
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Features, Challenges and Applications of Particle Image Velocimetry Cover Image
By Sasha Kremke (Editor)
$173.94
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Measurement Essentials Cover Image
By Miles Eron (Editor)
$185.54
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Measurement Systems: Applications and Design Cover Image
By Miles Eron (Editor)
$185.54
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